An EDA perspective on chips transforming into 3D systems
By Martin Biehl, AE director at Cadence
To meet today’s demands of increased functional density, higher bandwidths, lower power, smaller form-factors and lower costs, design teams are pivoting from Moore’s Law to More-than-Moore; a world of advanced packaging techniques involving multiple stacked and unstacked chiplets in a single package. Helping to accelerate this trend, the large IC foundries are now competing with the traditional packaging solution providers (OSATs) by providing their own back-end/packaging solutions based on wafer-level manufacturing techniques. The result is an explosion in the number of packaging technologies, and in the process, shifting semiconductor packaging from a necessary evil to a value-add, differentiating technology. From this presentation, you will learn about trends in advanced multi-chip(let) architectures, and design challenges for package and IC engineers when migrating to cutting-edge 2.5D and 3D packaging solutions.
Biography:
Martin Biehl is AE director at Cadence responsible for the PCB, IC Package and Multi Systems Analysis tools in Europe. Martin holds a PhD in Electrical Engineering from university Karlsruhe Germany. He worked 7 years in a PCB design team at Siemens before joining Cadence in 2005.”
Related Chiplet
- Integrated voltage regulator (IVR) chiplet
- High-performance connectivity chiplets
- eFPGA Chiplet
- DPIQ Tx PICs
- IMDD Tx PICs
Related Videos
- Impact of Chiplets, Heterogeneous Integration and Modularity on AI and HPC systems
- Towards wafer-scale optical interconnect relying on Silicon Photonics and advanced 3D assembly
- “Dating” and “Marrying”: An AI Chiplet’s Perspective
- Revolutionizing AI & Chiplets: Baya Systems CEO on $36M Series B, UALink, Future of Data Movement
Latest Videos
- 2026 DRAM and Advanced Packaging Master Class
- Chiplets, RISC-V, and Europe's AI Silicon Ambition
- Driving the Future of Automotive Compute with UCIe
- A Physics-Informed Neural Network Surrogate for Runtime PDN and Dynamic Droop Prediction in 2.5-D Chiplet Integration
- A Chiplet Interface Model for System-Level PPA Exploration