Advanced Optical Integration Processes for Photonic-Integrated Circuit Packaging
By Keuntae Baek, Minhyeok Kim, Hak-Sung Kim, Jinho Ahn, Hongyun So
Hanyang University, Seoul, South Korea
Abstract
Photonic integrated chip packaging is a promising technology for integrating optical components into devices, enabling high-speed data transmission, wide bandwidth, low latency, and high energy efficiency. This technology is expected to overcome the limitations of traditional electronic component technologies. Particularly, recent advancements in high-performance semiconductors, quantum computing, and data centers demand high-speed data processing and transmission. In response to these demands, device packaging developments have focused on achieving compactness, high efficiency, and high performance. Photonic integrated chip packaging emerges as a promising approach to meet these demands. This review discusses the latest developments in photonic integrated chip packaging at the component, chip, and system levels. It also highlights the current issues and challenges of these technologies and provides future perspectives.
Related Chiplet
- DPIQ Tx PICs
- IMDD Tx PICs
- Near-Packaged Optics (NPO) Chiplet Solution
- High Performance Droplet
- Interconnect Chiplet
Related Technical Papers
- Workflows for tackling heterogeneous integration of chiplets for 2.5D/3D semiconductor packaging
- High-Bandwidth Chiplet Interconnects for Advanced Packaging Technologies in AI/ML Applications: Challenges and Solutions
- Advanced Packaging and Chiplets Can Be for Everyone
- Ammonia Plasma Surface Treatment for Enhanced Cu–Cu Bonding Reliability for Advanced Packaging Interconnection
Latest Technical Papers
- Advances in waveguide to waveguide couplers for 3D integrated photonic packaging
- Lifecycle Cost-Effectiveness Modeling for Redundancy-Enhanced Multi-Chiplet Architectures
- DISTIL: A Distributed Spiking Neural Network Accelerator on 2.5D Chiplet Systems
- Multi-Partner Project: COIN-3D -- Collaborative Innovation in 3D VLSI Reliability
- EOTPR Fine Pitch Probing for Die-to-Die Interconnect Failure Analysis