Leveraging 3D Technologies for Hardware Security: Opportunities and Challenges
By Peng Gu 1, Shuangchen Li 1, Dylan Stow 1, Russell Barnes 1, Liu Liu 1, Yuan Xie 1, Eren Kursshan 2
1 University of California, Santa Barbara
2 Columbia University, New York

Abstract
3D die stacking and 2.5D interposer design are promising technologies to improve integration density, performance and cost. Current approaches face serious issues in dealing with emerging security challenges such as side channel attacks, hardware trojans, secure IC manufacturing and IP piracy. By utilizing intrinsic characteristics of 2.5D and 3D technologies, we propose novel opportunities in designing secure systems. We present: (i) a 3D architecture for shielding side-channel information; (ii) split fabrication using active interposers; (iii) circuit camouflage on monolithic 3D IC, and (iv) 3D IC-based security processing-in-memory (PIM). Advantages and challenges of these designs are discussed, showing that the new designs can improve existing countermeasures against security threats and further provide new security features.
To read the full article, click here
Related Chiplet
- DPIQ Tx PICs
- IMDD Tx PICs
- Near-Packaged Optics (NPO) Chiplet Solution
- High Performance Droplet
- Interconnect Chiplet
Related Technical Papers
- On hardware security and trust for chiplet-based 2.5D and 3D ICs: Challenges and Innovations
- Challenges and Opportunities to Enable Large-Scale Computing via Heterogeneous Chiplets
- Small Dies, Big Dreams: Challenges and Opportunities in Chiplet Commoditization
- High-Bandwidth Chiplet Interconnects for Advanced Packaging Technologies in AI/ML Applications: Challenges and Solutions
Latest Technical Papers
- Transient Multiscale Workflow for Thermal Analysis of 3DHI Chip Stack
- Dispersion-Engineered Terahertz Silicon Interconnects Enabling Terabit-Scale Data Links
- Design-Oriented Modeling of TSV Substrate Noise Coupling to Ring VCOs
- CLIPGen: A Chiplet Link IP Modeling and Generation Framework for 2.5D Architecture Exploration
- Wafer Warpage of Silicon Interposer in Manufacturing Processes for High Density 2.5D Advanced Packaging: Causes, Measurement, Analysis and Optimization