Chiplets: 8 best practices for engineering multi-die designs
Semiconductor design is in the midst of a structural shift. For decades, performance gains were achieved by packing more transistors into single, monolithic dies. But the physical limitations of these dies—and the process technologies used to create them—are at odds with the ever-increasing compute, memory, and I/O demands of modern workloads. In other words, process technology advances alone are not enough to keep up with modern workloads.
Stepping in to address these demands are multi-die designs, which combine several smaller dies (known as chiplets) inside a single standard or advanced package. These multi-die architectures are reshaping how engineers build everything from AI accelerators to automotive ADAS systems. By disaggregating compute, memory, and I/O, teams can mix and match chiplets—often from different process nodes—to optimize performance, energy efficiency, size, or cost.
However, multi-die designs introduce new engineering complexities and design considerations, spanning packaging, verification, thermal dynamics, and more.
Here are eight best practices for developing chiplet designs.
To read the full article, click here
Related Chiplet
- Optical Chiplet
- Reverse Gearbox Chiplet
- FlexGen Multi-Die Smart Network-on-Chip (NoC) IP
- Ncore Multi-Die Interconnect IP
- Integrated voltage regulator (IVR) chiplet
Related Blogs
- A Beginner’s Guide to Chiplets: 8 Best Practices for Multi-Die Designs
- Integrated Design Ecosystem™ for Chiplets and Heterogeneous Integration in Advanced Packaging Technology
- Streamlining Functional Verification for Multi-Die and Chiplet Designs
- Interface IP: The Keystone for 3D Multi-Die Designs