The Right Testing Strategy Can Save Designs

By Nitza Basoco, Teradyne

Chiplet-based designs complicate testing and add new urgency to getting it done better and earlier. Developers simply must dispose of bad dies as soon as possible to keep costs and schedules under control. Heterogeneous integration is a particularly expensive and time-consuming new step, while packaging has become much more difficult and much costlier. Good testing is essential to having good silicon at a reasonable price.

Introduction
Complexity Is Increasing Exponentially
Complexity Is Increasing Exponentially
Chiplets WILL be Everywhere
Test Flow Tradeoffs in the Era of Complexity
Test Flow Tradeoffs in the Era of Complexity
Vulnerability
Advanced Packaging Test Challenges
Si Device Assumptions : What’s inside of this package anyways?
Cost Assumptions: How MUCH does that Cost?
Si Device Laguna Production Flow Estimates
Si Device Laguna Production Flow Estimates
% of Device Cost
Fiscal Optimization
Fiscal Optimization
Optimizing Test in The Era of Complexity Saves Cost
Teradyne
About Nitza Basoco